Advanced Methods of Transmission Electron Microscopy and Nanoanalysis

Course Description

Course is offered only upon students’ interest.

The course begins by establishing a historical context and elucidating the fundamental principles of electron microscopy, offering a comparative overview with other microscopy techniques. Subsequently, students explore the components of a Transmission Electron Microscope, gaining insights into electron sources, lenses, detectors, and imaging systems.

A significant portion of the course is dedicated to the diverse techniques and modes employed in TEM, including bright-field and dark-field imaging, high-resolution TEM, and electron diffraction. Practical aspects of sample preparation, such as fixation, embedding, and staining, are covered in detail, along with contemporary techniques like cryo-TEM and in-situ methodologies.

The course concludes with an exploration of recent advances and future prospects in TEM and nanoanalysis, focusing on aberration correction, in-situ techniques, and emerging technologies.

Course Info

Group:  Elective

Semester:  Second Semester

Hours / Week:   2

ECTS Units:  4

Instructors:  Cour